• 300 kHz to 6 GHz
• Integrated 1 Hz resolution synthesized source
• Direct save/recall to an external disk drive
• Time domain analysis
• Execute complex test procedures with the test sequence function
• 100 dB of dynamic range
• Group delay and deviation from linear phase
• 0.001 dB, 0.01 deg, 0.01 nanosec marker resolution
• Built-in accuracy enhancement
• Swept harmonic measurements

The HP 8753C network analyzer provides excellent RF network measurements for lab and production test areas. When combined with a test set, it provides a complete solution for characterizing linear behavior of either active or passive networks, devices, or components from 300 kHz to 6 GHz. With two independent display channels available, you can simultaneously measure and view the reflection and transmission characteristics of the device under test in overlay or split-screen format on the crisp color display. The easy-to-use softkey selection of measurement functions allows you to measure the magnitude, phase, or group delay characteristics of your device under test.

The test sequence function allows rapid and consistent execution of complex repetitive tests with a single keystroke. In sequencing mode, you make the measurement once from the front panel, and the instrument stores the keystrokes so that no additional programming expertise is required. You can even set other HP-IB instruments with a test sequence. Other productivity enhancements include a plot/print buffer, limit testing, arbitrary frequency testing, and marker tracking functions. Segmented calibration and interpolative error correction allow you to apply vector accuracy enhancement over a subset of the frequency range that you initially calibrated the HP 8753C.

The integrated synthesized source provides > 100 mV of output power, 1 Hz frequency resolution, and linear, log, list, power, and CW sweep types. Three tuned, 300 kHz to 3 GHz (Option 006 extends to 6 GHz) receivers allow versatile independent power measurements or simultaneous ratio measurements over a 100 dB dynamic range. By using the HP 85047A Test Set with the HP 8753C, the reflection and transmission characteristics of the device under test can be investigated from 300 kHz to 3 GHz or from 3 MHz to 6 GHz with the test set's frequency doubler enabled.

on-Linear Device Testing

Non-linear device characterization is possible with the HP 8753C. Swept second-and third-harmonic levels of an amplifier can be displayed directly or relative to the fundamental carrier (dBc) when employing the optional harmonic measurement capability (Option 002). Amplifier harmonics up to 40 dBc can be measured quickly and conveniently on a swept-frequency basis for fundamental signals as low as 16 MHz, using the same test configuration used to measure gain. Power meter calibration provides leveled absolute power to devices that are sensitive to absolute input or output levels. The HP 8753C automatically controls an HP 436A, 437B, or 438A Power Meter to set the power anywhere in the test configuration with power meter accuracy.

The HP 8753C has the capability to perform mixer tracking and conversion loss measurements. These are possible because the tuned receiver can be offset from its synthesized source by the LO frequency of the mixer. Both fixed and swept IF measurements can be made.

ime Domain Analysis

Time domain responses can be displayed by the HP 8753C with Option 010. The instrument computes the inverse Fourier transform of the frequency domain data to display the reflection or transmission coefficient versus time. The HP 8753C offers two time domain modes. The low-pass mode provides the traditional Time Domain Reflectometer (TDR) measurement capability and gives the response of the network to a mathematically simulated step or impulse response. This mode gives information of the type of impedance (R, L, C) at the discontinuity. The bandpass time domain mode, which has only the impulse stimulus, has no frequency restrictions and provides the time domain response of frequency selective devices such as SAW filters or antennas. Gating may be used to selectively isolate a single response to view the frequency domain response of individual portions of a component without disturbing the circuit itself.